- The lost yield of Stochastic costs billions of chipmakers to advanced process nodes
- Current methods of processes are not sufficient to resolve stochastic failures with high volume
- The new white paper describes design and measurement solutions to fill the Gap stochastic
A new white paper has said that the semiconductor industry loses billions of dollars due to something that can be heard of: stochastic variability.
This form of variation in random structuring is now considered the largest obstacle to obtain high yields at the most advanced process nodes.
The document was brought by Austin, Texas, Fracilia, whose CTO, Chris Mack, noted: “Stochastic variability contributes to delays of several billion dollars in the introduction of advanced process technology in high volume manufacturing.”
Affecting yield, performance and reliability
Mack also explained that current processes control strategies had not been able to treat these random effects.
“The Stochastic difference commission requires completely different methodologies that the manufacturers of devices need to validate and adopt,” said Mack.
The Fractilia defines this “stochastic gap” as the difference between what can be moderate in research and what can be reliably produced to acceptable yields.
At the heart of this gap is a random rooted in the physics of materials, molecules and light sources used in the production of fleas.
Although these effects are once negligible, they now consume an increasing part of the manufacturing errors’ budget.
“We have seen our customers make dense features as small as 12 nanometers in research and development,” said Mack. “But when they try to move it to manufacturing, stochastic failures affect their ability to obtain acceptable performance, performance and reliability.”
The problem developed alongside the rise of the EUV and the high EUV lithography. These advances allowed manufacturers of fleas to try even smaller features, but also made them more vulnerable to stochastic defects.
Unlike conventional variability, this type cannot be eliminated with stricter orders, it must be managed with design and measurement techniques based on probabilities.
“The stochastic gap is a problem on the industry level,” said Mack. “This problem can be minimized and controlled, but it all starts with a precise stochastic measurement technology.”
The white paper, which you can download here, includes an analysis of the problem and offers the conscious design of stochasts, innovation of materials and controls of processes updated as a path to appear.
